Characterization of Interaction Layer in U-Mo-X (X = Nb, Zr) and U-Nb-Zr vs. Al Diffusion Couples Annealed at 600°C for 10 Hours
Ewh, Ashley, Perez, E., Keiser, Dennis D., Sohn, Yong HoVolume:
312-315
Language:
english
Journal:
Defect and Diffusion Forum
DOI:
10.4028/www.scientific.net/DDF.312-315.1055
Date:
April, 2011
File:
PDF, 2.57 MB
english, 2011