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ECS Transactions [ECS 218th ECS Meeting - Las Vegas, NV (October 10 - October 15, 2010)] - (Invited) Charge Trapping and the Negative Bias Temperature Instability
Goes, Wolfgang, Schanovsky, Franz, Hehenberger, Philipp, Wagner, Paul-Juergen, Grasser, TiborYear:
2010
Language:
english
DOI:
10.1149/1.3481647
File:
PDF, 4.54 MB
english, 2010