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Defects Induced by High Electric Field Stress and the Trivalent Silicon Defects at the Si-Si02 Interface
Vuillaume, D., Mir, A., Goguenheim, D.Volume:
83-87
Year:
1992
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.83-87.1427
File:
PDF, 362 KB
1992