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[IEEE 2014 International Conference on Actual Problems of Electron Devices Engineering (APEDE) - Saratov, Russia (2014.9.25-2014.9.26)] 2014 International Conference on Actual Problems of Electron Devices Engineering (APEDE) - Anisotropic etching of profiled membrabes for pressure sensors based on silicon-on-insulator structure

Evdokimov, S. P.
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Year:
2014
DOI:
10.1109/APEDE.2014.6958212
File:
PDF, 163 KB
2014
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