Recent trends in quantitative aspects of microscopic X-ray...

Recent trends in quantitative aspects of microscopic X-ray fluorescence analysis

Koen Janssens, Wout De Nolf, Geert Van Der Snickt, Laszlo Vincze, Bart Vekemans, Roberto Terzano, Frank E. Brenker
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Volume:
29
Year:
2010
Language:
english
Pages:
15
DOI:
10.1016/j.trac.2010.03.003
File:
PDF, 448 KB
english, 2010
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