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Applications of Mössbauer Spectroscopy to Investigations of Defects in Semiconductors
Nylandsted-Larsen, Arne, Petersen, J.W., Weyer, G.Volume:
38-41
Year:
1989
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.38-41.1137
File:
PDF, 571 KB
1989