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A Comparison of Free Carrier Absorption and Capacitance Voltage Methods for Interface Trap Measurements
Suvanam, Sethu Saveda, Usman, M., Gulbinas, K., Grivickas, V., Hallén, AndersVolume:
740-742
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.740-742.465
Date:
January, 2013
File:
PDF, 333 KB
english, 2013