The Study on Fatigue Life of Interconnect with Respect to...

The Study on Fatigue Life of Interconnect with Respect to Geometrical Shape of Supporting Structure and Load Conditions in MEMS

Shim, Jae Joon, Han, Geun Jo, Kim, Kwang Young, Yun, Doo Pyo, Ok, Chul Ho, Lee, Sang Suk
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Volume:
297-300
Year:
2005
Language:
english
Journal:
Key Engineering Materials
DOI:
10.4028/www.scientific.net/KEM.297-300.539
File:
PDF, 445 KB
english, 2005
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