On the Way to the Equivalence between Measured Parameters...

On the Way to the Equivalence between Measured Parameters Using Non-Notched and Notched Woven Specimens of SiC/C/SiC Composites

Drissi-Habti, M., Chermant, Jean-Louis, Rouby, Dominique
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Volume:
164-165
Year:
1999
Journal:
Key Engineering Materials
DOI:
10.4028/www.scientific.net/KEM.164-165.253
File:
PDF, 365 KB
1999
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