Fractal characterization of the silicon surfaces produced...

Applied Surface Science 2015 / 08 Vol. 347

Fractal characterization of the silicon surfaces produced by ion beam irradiation of varying fluences

Yadav, R.P., Kumar, T., Mittal, A.K., Dwivedi, S., Kanjilal, D.
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Volume:
347
Language:
english
Journal:
Applied Surface Science
DOI:
10.1016/j.apsusc.2015.04.150
Date:
August, 2015
File:
PDF, 2.29 MB
english, 2015
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