The effect of pattern overlap on the accuracy of high...

Ultramicroscopy 2015 / 08 Vol. 155

The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements

Tong, Vivian, Jiang, Jun, Wilkinson, Angus J., Britton, T. Ben
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Volume:
155
Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2015.04.019
Date:
August, 2015
File:
PDF, 3.44 MB
english, 2015
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