Three-Dimensional Micron-Resolution X-Ray Laue Diffraction Measurement of Thermal Grain-Evolution in Aluminum
Budai, J.D., Yang, W., Larson, B.C., Tischler, J.Z., Liu, W., Weiland, Hasso, Ice, Gene E.Volume:
467-470
Year:
2004
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.467-470.1373
File:
PDF, 1.16 MB
english, 2004