Observation of Different Interfaces in Silicon Nitride by...

Key Engineering Materials 1997 Vol. 132-136

Observation of Different Interfaces in Silicon Nitride by HRTEM. Influence of the Microstructure on the Creep Properties.

Bernard-Granger, Guillaume, Calès, Bernard, Duclos, Richard, Crampon, Jacques
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Volume:
132-136
Year:
1997
Journal:
Key Engineering Materials
DOI:
10.4028/www.scientific.net/KEM.132-136.559
File:
PDF, 431 KB
1997
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