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IC Tomography and Infrared Tomography Techniques to Monitor Defect Sites in Palm Tree Trunks
Al-Sulaiman, Faleh, Hawwa, MuhammadVolume:
445
Language:
english
Journal:
Advanced Materials Research
DOI:
10.4028/www.scientific.net/AMR.445.1053
Date:
January, 2012
File:
PDF, 437 KB
english, 2012