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Nickel oxide interlayer films from nickel formate–ethylenediamine precursor: influence of annealing on thin film properties and photovoltaic device performance
Steirer, K. X., Richards, R. E., Sigdel, A. K., Garcia, A., Ndione, P. F., Hammond, S., Baker, D., Ratcliff, E. L., Curtis, C., Furtak, T., Ginley, D. S., Olson, D. C., Armstrong, N. R., Berry, J. J.Volume:
3
Year:
2015
Language:
english
Journal:
J. Mater. Chem. A
DOI:
10.1039/c5ta01379h
File:
PDF, 1.53 MB
english, 2015