[ECS 208th ECS Meeting - Los Angeles, California (October 16-October 21, 2005)] ECS Transactions - Charge Trapping & NBTI in High k Gate Dielectric Stacks
Zafar, Sufi, Callegari, Alessando, Stathis, JamesVolume:
1
Year:
2006
Language:
english
DOI:
10.1149/1.2209307
File:
PDF, 211 KB
english, 2006