I–V characteristics of tantalum oxide film and the effect...

Thin Solid Films 2004 Vol. 458; Iss. 1-2

I–V characteristics of tantalum oxide film and the effect of defects on its electrical properties

Chao Wang, Ling Fang, Gong Zhang, Da-Ming Zhuang, Min-Sheng Wu
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Volume:
458
Year:
2004
Language:
english
Pages:
5
DOI:
10.1016/j.tsf.2003.11.269
File:
PDF, 346 KB
english, 2004
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