The electronic properties of the interface between a thin...

The electronic properties of the interface between a thin conjugated oligomer film and SiO2/Si(111), studied by photoemission spectroscopies

V Papaefthimiou, A Siokou, S Kennou
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Volume:
459
Year:
2004
Language:
english
Pages:
5
DOI:
10.1016/j.tsf.2003.12.089
File:
PDF, 159 KB
english, 2004
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