![](/img/cover-not-exists.png)
The electronic properties of the interface between a thin conjugated oligomer film and SiO2/Si(111), studied by photoemission spectroscopies
V Papaefthimiou, A Siokou, S KennouVolume:
459
Year:
2004
Language:
english
Pages:
5
DOI:
10.1016/j.tsf.2003.12.089
File:
PDF, 159 KB
english, 2004