Spectroscopic ellipsometry studies on the optical constants...

Spectroscopic ellipsometry studies on the optical constants of indium tin oxide films deposited under various sputtering conditions

Yeon Sik Jung
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Volume:
467
Year:
2004
Language:
english
Pages:
7
DOI:
10.1016/j.tsf.2004.02.047
File:
PDF, 606 KB
english, 2004
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