![](/img/cover-not-exists.png)
Spectroscopic ellipsometry studies on the optical constants of indium tin oxide films deposited under various sputtering conditions
Yeon Sik JungVolume:
467
Year:
2004
Language:
english
Pages:
7
DOI:
10.1016/j.tsf.2004.02.047
File:
PDF, 606 KB
english, 2004