Oxidation mechanism of ionic transport of copper in SiO2...

Oxidation mechanism of ionic transport of copper in SiO2 dielectrics

Brian G. Willis, David V. Lang
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Volume:
467
Year:
2004
Language:
english
Pages:
10
DOI:
10.1016/j.tsf.2004.04.028
File:
PDF, 1.16 MB
english, 2004
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