Polarization Light Optical Texture Analysis for the...

Advances in Science and Technology 2006 Vol. 45

Polarization Light Optical Texture Analysis for the Structural Characterization of CIM Components

Rauch, Johannes, Kern, Frank, Gadow, Rainer
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Volume:
45
Year:
2006
Language:
english
Journal:
Advances in Science and Technology
DOI:
10.4028/www.scientific.net/AST.45.1690
File:
PDF, 2.28 MB
english, 2006
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