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ECS Transactions [ECS 218th ECS Meeting - Las Vegas, NV (October 10 - October 15, 2010)] - Electrical Properties of Yttrium-Titanium Oxide High-k Gate Dielectric on Ge
Bera, Milan K., Ahmet, P., Kakushima, K., Tsutsui, K., Sugii, Nobuyuki, Nishiyama, Akira, Hattori, T., Iwai, H.Year:
2010
Language:
english
DOI:
10.1149/1.3487558
File:
PDF, 279 KB
english, 2010