Correlation between the dielectric constant and X-ray...

Thin Solid Films 2004 Vol. 468; Iss. 1-2

Correlation between the dielectric constant and X-ray diffraction pattern of Si-O-C thin films with hydrogen bonds

Teresa Oh, Kyoung Suk Oh, Kwang-Man Lee, Chi Kyu Choi
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
468
Year:
2004
Language:
english
Pages:
6
DOI:
10.1016/j.tsf.2004.06.089
File:
PDF, 1.02 MB
english, 2004
Conversion to is in progress
Conversion to is failed