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In Situ Scanning Electron Microscopy Observation of the Pattern Formation on the Surface of Al/Ge Bilayer Films
Kumagai, H., Shibata, M., Moritani, Tomokazu, Kozakai, Takao, Doi, Minoru, Takagi, Makoto, Imura, ToruVolume:
539-543
Year:
2007
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.539-543.3568
File:
PDF, 6.60 MB
english, 2007