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Measurement of thin film elastic constants by X-ray diffraction
D. Faurie, P.-O. Renault, E. Le Bourhis, P. Villain, Ph Goudeau, F. BadawiVolume:
469-470
Year:
2004
Language:
english
Pages:
5
DOI:
10.1016/j.tsf.2004.08.097
File:
PDF, 225 KB
english, 2004