Combinatorial approach to the edge delamination test for...

Combinatorial approach to the edge delamination test for thin film reliability—adaptability and variability

Martin Y.M. Chiang, Rui Song, Alfred J. Crosby, Alamgir Karim, Chwan K. Chiang, Eric J. Amis
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Volume:
476
Year:
2005
Language:
english
Pages:
7
DOI:
10.1016/j.tsf.2004.10.028
File:
PDF, 688 KB
english, 2005
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