Combinatorial approach to the edge delamination test for thin film reliability—adaptability and variability
Martin Y.M. Chiang, Rui Song, Alfred J. Crosby, Alamgir Karim, Chwan K. Chiang, Eric J. AmisVolume:
476
Year:
2005
Language:
english
Pages:
7
DOI:
10.1016/j.tsf.2004.10.028
File:
PDF, 688 KB
english, 2005