Carrier-induced mechanism for defect formation in...

Carrier-induced mechanism for defect formation in hydrogenated amorphous silicon

Redfield, David, Bube, Richard H.
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Volume:
74
Language:
english
Journal:
Philosophical Magazine Part B
DOI:
10.1080/01418639608243527
Date:
September, 1996
File:
PDF, 491 KB
english, 1996
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