Structural characterization of AlxGa1−xSb films grown at...

Thin Solid Films 2005 Vol. 479; Iss. 1-2

Structural characterization of AlxGa1−xSb films grown at low temperatures by liquid phase epitaxy

E. Rosendo, T. Díaz, J. Martínez, H. Juárez, G. Juárez
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Volume:
479
Year:
2005
Language:
english
Pages:
4
DOI:
10.1016/j.tsf.2004.11.208
File:
PDF, 154 KB
english, 2005
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