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Characterization of Grain Boundaries of Al-doped Sintered β-SiC by Both HRTEM and STEM
Kaneko, Kenji, Saitoh, T., Tsurekawa, SadahiroVolume:
294-296
Year:
1999
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.294-296.269
File:
PDF, 422 KB
1999