Uniformity and stoichiometry of large-area multicomponent...

Uniformity and stoichiometry of large-area multicomponent oxide thin films deposited by sputtering

B.W. Tao, J.J. Chen, X.Z. Liu, Y.R. Li, R. Fromknecht, J. Geerk
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Volume:
485
Year:
2005
Language:
english
Pages:
6
DOI:
10.1016/j.tsf.2005.03.013
File:
PDF, 300 KB
english, 2005
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