Characterization of molecular assemblies on silicon...

Thin Solid Films 2006 Vol. 499; Iss. 1-2

Characterization of molecular assemblies on silicon surfaces by attenuated total reflectance infrared spectroscopy

Masato Ara, Ryo Yamada, Hirokazu Tada
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Volume:
499
Year:
2006
Language:
english
Pages:
5
DOI:
10.1016/j.tsf.2005.07.045
File:
PDF, 186 KB
english, 2006
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