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Microstructural defect characterisation of a-Si:H deposited by low temperature HW-CVD on paper substrates
D.T. Britton, M. Härting, D. Knoesen, Z. Sigcau, F.P. Nemalili, T.P. Ntsoane, P. Sperr, W. Egger, M. NippusVolume:
501
Year:
2006
Language:
english
Pages:
5
DOI:
10.1016/j.tsf.2005.07.111
File:
PDF, 300 KB
english, 2006