Application of deconvolution to boron depth profiling in...

Application of deconvolution to boron depth profiling in SiGe heterostructures

Ming Hong Yang, Gary G. Goodman
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Volume:
508
Year:
2006
Language:
english
Pages:
3
DOI:
10.1016/j.tsf.2005.07.330
File:
PDF, 221 KB
english, 2006
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