Adsorption–desorption isotherms of nanoporous thin films measured by X-ray reflectometry
M. Klotz, V. Rouessac, D. Rébiscoul, A. Ayral, A. van der LeeVolume:
495
Year:
2006
Language:
english
Pages:
5
DOI:
10.1016/j.tsf.2005.08.168
File:
PDF, 120 KB
english, 2006