Characterisation of mesostructured TiO2 thin layers by ellipsometric porosimetry
V. Rouessac, R. Coustel, F. Bosc, J. Durand, A. AyralVolume:
495
Year:
2006
Language:
english
Pages:
5
DOI:
10.1016/j.tsf.2005.08.334
File:
PDF, 170 KB
english, 2006