X-ray reflectivity, diffraction and grazing incidence small...

Thin Solid Films 2006 Vol. 495; Iss. 1-2

X-ray reflectivity, diffraction and grazing incidence small angle X-ray scattering as complementary methods in the microstructural study of sol–gel zirconia thin films

P. Lenormand, A. Lecomte, D. Babonneau, A. Dauger
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Volume:
495
Year:
2006
Language:
english
Pages:
8
DOI:
10.1016/j.tsf.2005.08.335
File:
PDF, 1.13 MB
english, 2006
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