X-ray reflectivity study of acid–base post-synthesis...

Thin Solid Films 2006 Vol. 495; Iss. 1-2

X-ray reflectivity study of acid–base post-synthesis treatments of mesoporous thin films templated by P123

J.-F. Bardeau, A. Gourbil, M. Dutreilh-Colas, S. Dourdain, A. Mehdi, A. Gibaud
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Volume:
495
Year:
2006
Language:
english
Pages:
6
DOI:
10.1016/j.tsf.2005.08.357
File:
PDF, 221 KB
english, 2006
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