Study of fast diffusion species in Sc/Si multilayers by W-based marker analysis
D.L. Voronov, E.N. Zubarev, V.V. Kondratenko, Yu.P. Pershin, V.A. Sevryukova, Ye.A. BugayevVolume:
513
Year:
2006
Language:
english
Pages:
7
DOI:
10.1016/j.tsf.2006.01.070
File:
PDF, 407 KB
english, 2006