Non-destructive X-ray study of the interphases in Mo/Si and...

Thin Solid Films 2006 Vol. 514; Iss. 1-2

Non-destructive X-ray study of the interphases in Mo/Si and Mo/B4C/Si/B4C multilayers

H. Maury, P. Jonnard, J.-M. André, J. Gautier, M. Roulliay, F. Bridou, F. Delmotte, M.-F. Ravet, A. Jérome, P. Holliger
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Volume:
514
Year:
2006
Language:
english
Pages:
9
DOI:
10.1016/j.tsf.2006.02.073
File:
PDF, 478 KB
english, 2006
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