Diffusion of 6Li in Tantalum and Tungsten Studied by the Neutron Depth Profiling Technique
Vacik, J., Köster, Uwe, Hnatowicz, V., Cervena, J., Pasold, G.Volume:
237-240
Year:
2005
Language:
english
Journal:
Defect and Diffusion Forum
DOI:
10.4028/www.scientific.net/DDF.237-240.485
File:
PDF, 234 KB
english, 2005