Study on electrical degradation of p-type low-temperature...

Thin Solid Films 2006 Vol. 515; Iss. 3

Study on electrical degradation of p-type low-temperature polycrystalline silicon thin film transistors with C–V measurement analysis

Shih-Che Huang, Yu-Han Kao, Ya-Hsiang Tai
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Volume:
515
Year:
2006
Language:
english
Pages:
4
DOI:
10.1016/j.tsf.2006.07.127
File:
PDF, 379 KB
english, 2006
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