Depth Profiling of Defects in Argon Irradiated Silicon Using Positron Beam Facility at Kalpakkam
Amarendra, G., Venugopal Rao, G., Nair, K.G.M., Viswanathan, B.Volume:
255-257
Year:
1997
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.255-257.650
File:
PDF, 258 KB
1997