Depth Profiling of Defects in Argon Irradiated Silicon...

Depth Profiling of Defects in Argon Irradiated Silicon Using Positron Beam Facility at Kalpakkam

Amarendra, G., Venugopal Rao, G., Nair, K.G.M., Viswanathan, B.
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Volume:
255-257
Year:
1997
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.255-257.650
File:
PDF, 258 KB
1997
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