Initial reaction of HfO2 atomic layer deposition on silicon...

Initial reaction of HfO2 atomic layer deposition on silicon surfaces with different oxygen levels: A density functional theory study

Jie Ren, Feng-Yi Liu, Ya-Tong Zhang, David Wei Zhang
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Volume:
515
Year:
2007
Language:
english
Pages:
7
DOI:
10.1016/j.tsf.2006.11.045
File:
PDF, 759 KB
english, 2007
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