Determination of band offsets in a-Si:H/c-Si...

Thin Solid Films 2007 Vol. 515; Iss. 19

Determination of band offsets in a-Si:H/c-Si heterojunctions from capacitance–voltage measurements: Capabilities and limits

A.S. Gudovskikh, S. Ibrahim, J.-P. Kleider, J. Damon-Lacoste, P. Roca i Cabarrocas, Y. Veschetti, P.-J. Ribeyron
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Volume:
515
Year:
2007
Language:
english
Pages:
5
DOI:
10.1016/j.tsf.2006.11.198
File:
PDF, 379 KB
english, 2007
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