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Increased localization precision by interference fringe analysis
Ebeling, Carl G., Meiri, Amihai, Martineau, Jason, Zalevsky, Zeev, Gerton, Jordan M., Menon, RajeshVolume:
7
Year:
2015
Language:
english
Journal:
Nanoscale
DOI:
10.1039/C5NR01927C
File:
PDF, 1.37 MB
english, 2015