Investigation of shear distance in Michelson interferometer-based shearography for mechanical characterization
Lee, Jung-Ryul, Yoon, Dong-Jin, Kim, Jung-Seok, Vautrin, AlainVolume:
19
Language:
english
Journal:
Measurement Science and Technology
DOI:
10.1088/0957-0233/19/11/115303
Date:
November, 2008
File:
PDF, 1.41 MB
english, 2008