Observation of negative differential resistance and...

Thin Solid Films 2008 Vol. 516; Iss. 9

Observation of negative differential resistance and single-electron tunneling in electromigrated break junctions

Yutaka Noguchi, Rieko Ueda, Tohru Kubota, Toshiya Kamikado, Shiyoshi Yokoyama, Takashi Nagase
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Volume:
516
Year:
2008
Language:
english
Pages:
5
DOI:
10.1016/j.tsf.2007.04.111
File:
PDF, 478 KB
english, 2008
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