Thickness identification of atomically thin InSe nanoflakes...

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Applied Surface Science 2015 / 4

Thickness identification of atomically thin InSe nanoflakes on SiO2/Si substrates by optical contrast analysis

Brotons-Gisbert, M., Sánchez-Royo, J.F., Martínez-Pastor, J.P.
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Language:
english
Journal:
Applied Surface Science
DOI:
10.1016/j.apsusc.2015.03.180
Date:
April, 2015
File:
PDF, 1.36 MB
english, 2015
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