On the Structure of Ge-Associated Defect Centers in...

Defect and Diffusion Forum 1987 Vol. 53-54

On the Structure of Ge-Associated Defect Centers in Irradiated High Purity GeO2 and Ge-Doped SiO2 Glasses

Tsai, T.E., Griscom, D.L., Friebele, E.J.
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Volume:
53-54
Year:
1987
Language:
english
Journal:
Defect and Diffusion Forum
DOI:
10.4028/www.scientific.net/DDF.53-54.469
File:
PDF, 424 KB
english, 1987
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