SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - Seattle, WA (Sunday 7 July 2002)] Polarization Measurement, Analysis, and Applications V - First results derived with a new sensor module for hyperspectral polarimetric measurements
Ruhtz, Thomas, Boesche, Eyk, Schroeder, Marc, Fischer, Juergen, Goldstein, Dennis H., Chenault, David B.Volume:
4819
Year:
2002
Language:
english
DOI:
10.1117/12.450515
File:
PDF, 427 KB
english, 2002